NDI Equipment Settings. Refer to Magnetic Particle Method, paragraph 1.4.8.
Inspection Procedure. A magnetic field shall be applied to the part perpendicular to the orientation of possible
cracks. Positions required for this inspection are illustrated in Figure 4-28.
Select AC on the AC/DC power switch.
Place probe/yoke on part in position 1 as shown.
Press the test switch and apply a light coat of magnetic particle media at the same time. Remove the media
momentarily before removing the current. Current should be applied for no more than five seconds.
Inspect for cracks using the black light.
Demagnetize before moving to the next position. Refer to paragraph 220.127.116.11.
Repeat steps a. through e. for position 2.
Marking and Recording of Inspection Results. Mark and record inspection results as required by paragraph
Demagnetization. With the switch remaining in the AC position, place the probe/yoke legs in the same
position used for magnetizing. Press the test switch and withdraw the probe/yoke from the part for a distance of two feet
before releasing the switch.
Backup Method. None required.
System Securing. Clean the main landing gear lower structural support thoroughly to remove all residual
magnetic particle media. Refer to Post Cleaning and Restoration of Part or Area After N DI, paragraph 1.4.16. The main
landing gear lower structural support, if removed, requires installation in accordance with the applicable technical
manuals listed in Table 1-1.
4.29 MAIN LANDING GEAR JACK PAD ADAPTER (MT).
Description (Figure 4-1. Index No. 29). The main landing gear jack pad adapters are found at the inside of
each of the main landing gear.
Defects. This inspection is used to verify crack indications found visually on the main landing gear jack pad
adapter. No cracks are allowed.
Primary Method. Magnetic Particle.
NDI Equipment and Materials. (Refer to Appendix B.)
Magnetic Particle Inspection Probe/Yoke
Fluorescent Magnetic Particles, refer to Table 1-8
Consumable Materials, refer to Table 1-8
Aircraft Marking Pencil, refer to Table 1-8